Cryo-FIB - Lamella Milling (Aquilos 2) Lab Cryo-EM Cryo-FIB - Lamella Milling (Aquilos 2) Lab Cryo-EM
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Cryo-FIB - Lamella Milling (Aquilos 2) Lab Cryo-EM
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Single Particle Analysis (SPA) Krios G4 300 kV Single Particle Analysis (SPA) Krios G4 300 kV
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Single Particle Analysis (SPA) Krios G4 300 kV
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Cryo-Electron Tomography (Cryo-ET) using Krios G4 Cryo-Electron Tomography (Cryo-ET) using Krios G4
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Cryo-Electron Tomography (Cryo-ET) using Krios G4
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Cryo FE-SEM (Aquilos 2) Lab Cryo EM Cryo FE-SEM (Aquilos 2) Lab Cryo EM
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Cryo FE-SEM (Aquilos 2) Lab Cryo EM
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Micro-CT Scan Micro-CT Scan
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Micro-CT Scan
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STEM EDS (Talos F200C G2) STEM EDS (Talos F200C G2)
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STEM EDS (Talos F200C G2)
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HRTEM (Talos F200C G2) HRTEM (Talos F200C G2)
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HRTEM (Talos F200C G2)
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ULTRAMICROTOME_PREPARASI LAMELLA PENGUJIAN TEM ULTRAMICROTOME_PREPARASI LAMELLA PENGUJIAN TEM
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ULTRAMICROTOME_PREPARASI LAMELLA PENGUJIAN TEM
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JASA ANALISIS SEM (Prisma E atau JEOL IT200) JASA ANALISIS SEM (Prisma E atau JEOL IT200)
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JASA ANALISIS SEM (Prisma E atau JEOL IT200)
Rp. 600.000
Pengujian FE-SEM Quattro S (Field Emmision Scanning Electron Microscope) Pengujian FE-SEM Quattro S (Field Emmision Scanning Electron Microscope)
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Pengujian FE-SEM Quattro S (Field Emmision Scanning Electron…
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Pengujian FE-SEM Quattro S dengan fitur EDS (Mapping /Point/Line) Pengujian FE-SEM Quattro S dengan fitur EDS (Mapping /Point/Line)
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Pengujian FE-SEM Quattro S dengan fitur EDS (Mapping /Point/Line)
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Karakterisasi Lanjut SEM Prisma E/ JEOL IT200 (Pengujian + Preparasi + Coating + EDS) Karakterisasi Lanjut SEM Prisma E/ JEOL IT200 (Pengujian + Preparasi + Coating + EDS)
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Karakterisasi Lanjut SEM Prisma E/ JEOL IT200 (Pengujian…
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